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Wheat Information
Service
Number 71: 24-26 (1990)
A study
of correlation and patn analysis in spring
wheat
I.S.Pawar, R.S.Paroda1 and S.Singh
Haryana Agricultural University, Hisar-125004, India
An important objective in most wheat breeding programmes is to
enhance the genetic potential for grain yield. Grain yield in wheat
is determined by three major components, namely, number of tillers
per plant or per unit area, average number of grains per ear and
average grain weight. A knowledge of inter-relationship between yield
and its components and among component traits themselves and path
analysis is essential to know the effectiveness of selection for
simultaneous improvement in these traits. Keeping all this in view,
an attempt was, therefore, made to have some information about the
relative contribution of these three important component traits to
the grain yield in spring wheat.
Materials and Methods
During 1983-84, fortyseven F4 progenies each of the
two wheat crosses, namely, WL 711 x HD 2122 (cross 1) and HD 2122 x
Sonalika (cross 2), were grown in a randomized block design with
three replications in single row plots of 2.5m length having row to
row distance of 23 cm and plant to plant distance of 10 cm. The
observations were recorded on ten randomly selected competitive
plants per plot for grain yield per plant, tiller number, grain
number and 1000-grain weight. Plot means were used for calculating
correlations and direct and indiect effects of three component traits
on grain yield. The path coefficient analysis was carried out as
described by Dewey and Lu (1959).
1. Director, National Bureau
of Plant Genetic Resources, Pusa Complex, New Delhi-110012.
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